Dr. Fugee Tsung
Hong Kong University of Science and Technology
Statistical process control (SPC) techniques are useful tools to reduce
variation and sustain improvement in the control phase of Six Sigma.
With advances in information, sensing, and data capture technology, large
volumes of data are being routinely collected and shared over
multiple-stage processes, which have growing impacts on the existing
SPC methods. This seminar will review the technical challenges and some
recent extensions in 1) SPC for profile monitoring 2) SPC for multistage
processes and 3) SPC and engineering process control.