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学术信息
SEMINARS
Recent Advances in Statistical Process Control
时间  Datetime
 
地点  Venue
报告人  Speaker
Dr. Fugee Tsung
单位  Affiliation
Hong Kong University of Science and Technology
邀请人  Host
韩东
报告摘要  Abstract
Statistical process control (SPC) techniques are useful tools to reduce variation and sustain improvement in the control phase of Six Sigma. With advances in information, sensing, and data capture technology, large volumes of data are being routinely collected and shared over multiple-stage processes, which have growing impacts on the existing SPC methods. This seminar will review the technical challenges and some recent extensions in 1) SPC for profile monitoring 2) SPC for multistage processes and 3) SPC and engineering process control.